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Get Diagnosis Of Vlsi Circuit Defects: Defects In Scan

On fault-tuple equivalence trees to further improve diagnosis quality. Abstract Approved: Thesis Supervisor Title and Department Date DIAGNOSIS OF VLSI CIRCUIT DEFECTS: DEFECTS IN SCAN CHAIN AND CIRCUIT LOGIC by Xun Tang A thesis submitted in partial fulfillment of the requirements for the Doctor of Philosophy degree in Electrical and Computer Engineering in the Graduate College of The University of Iowa December 2010.

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